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Investigation on hot-carrier-induced degradation of SOI NLIGBT.

Shifeng ZhangYan HanKoubao DingBin ZhangJiaxian Hu
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • high level
  • databases
  • neural network
  • real world
  • information retrieval
  • image processing
  • database systems