Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements.

Chih-Hung Chen Ying-Lien Wang M. H. Bakr Zheng Zeng

Published in: IEEE Trans. Instrum. Meas. (2008)

Keyphrases

parameter determination
measurement noise
measurement errors
noisy data
random noise
additive noise
low signal to noise ratio
noise reduction
signal to noise ratio
noise level
image noise
noise free
missing data
neural network
median filter
real time
arbitrary shape
information systems
low snr
learning algorithm