Generation of digital elevation models by using SIR-C/X-SAR multifrequency two-pass interferometry: the Etna case study.
Riccardo LanariGianfranco FornaroDaniele RiccioMaurizio MigliaccioKonstantinos P. PapathanassiouJoão R. MoreiraMarcus SchwäbischLuciano Vieira DutraGiuseppe PuglisiGiorgio FranceschettiMauro ColtelliPublished in: IEEE Trans. Geosci. Remote. Sens. (1996)