WideScan: Exploiting Out-of-Band Distortion for Device Classification Using Deep Learning.

Abdurrahman Elmaghbub Bechir Hamdaoui Arun Natarajan

Published in: GLOBECOM (2020)

Keyphrases

deep learning
machine learning
unsupervised learning
restricted boltzmann machine
pattern recognition
text classification
support vector machine
unsupervised feature learning
feature selection
model selection
decision trees
feature vectors
supervised learning
support vector
high dimensional
image classification