An ROBDD-Based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-on-Chip.
Juan A. CarrascoVíctor SuñéPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2009)
Keyphrases
- evaluation method
- optimization algorithm
- computational cost
- high accuracy
- synthetic data
- detection method
- objective function
- support vector machine svm
- dynamic programming
- classification accuracy
- gold standard
- high precision
- theoretical analysis
- experimental evaluation
- feature space
- preprocessing
- management system
- feature set
- distributed systems
- input data
- cost function
- prior knowledge
- clustering method
- pairwise
- segmentation method
- classification method
- computational complexity
- face recognition