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Technology Computer Aided Design Study of GaN MISFET With Double P-Buried Layers.

Ying WangMengtian BaoFei CaoJian-xiang TangXin Luo
Published in: IEEE Access (2019)
Keyphrases
  • computer aided design
  • data processing
  • computer aided
  • real time
  • pattern recognition
  • database
  • image processing
  • expert systems
  • viewpoint
  • object oriented
  • computer assisted
  • cad systems