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A 65-nm CMOS Wideband TDD Front-End With Integrated T/R Switching via PA Re-Use.
Xiao Xiao
Amanda Pratt
Bonjern Yang
Angie Wang
Ali M. Niknejad
Elad Alon
Borivoje Nikolic
Published in:
IEEE J. Solid State Circuits (2017)
Keyphrases
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high speed
back end
cmos technology
low power
nm technology
silicon on insulator
data sets
image processing
power consumption
high power
neural network
data management
wireless communication
analog vlsi
vlsi circuits