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Synapse classification and localization in Electron Micrographs.
Vignesh Jagadeesh
James R. Anderson
Bryan W. Jones
Robert Marc
Steven K. Fisher
B. S. Manjunath
Published in:
Pattern Recognit. Lett. (2014)
Keyphrases
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electron micrographs
pattern recognition
support vector machine svm
classification algorithm
feature selection
classification accuracy
support vector
image classification
training set
feature vectors
support vector machine
classification method
learning rules
neural network
text classification