Login / Signup

SCR-based ESD protection device with low trigger and high robustness for I/O clamp.

Yong-Seo KooKwang-Yeob Lee
Published in: IEICE Electron. Express (2012)
Keyphrases
  • high robustness
  • high accuracy
  • input output
  • high levels
  • data hiding scheme
  • neural network
  • response time
  • read write
  • database systems
  • multi dimensional
  • file system
  • highly correlated
  • garbage collection
  • packet losses