Sign in

Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices.

Benoît W. DenkingerFlavio PonzinaSoumya BasuAndrea BonettiSzabolcs BalásiMartino RuggieroMiguel Peón QuirósDavide RossiAndreas BurgDavid Atienza
Published in: IEEE Des. Test (2020)
Keyphrases
  • deep learning
  • unsupervised learning
  • data sets
  • weakly supervised
  • image processing
  • mental models
  • restricted boltzmann machine
  • unsupervised feature learning
  • machine learning
  • higher order