Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices.
Benoît W. DenkingerFlavio PonzinaSoumya BasuAndrea BonettiSzabolcs BalásiMartino RuggieroMiguel Peón QuirósDavide RossiAndreas BurgDavid AtienzaPublished in: IEEE Des. Test (2020)