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A secure collaborative e-diagnostics framework for semiconductor factories.

Min-Hsiung HungFeng-Yi HsuTsung-Li WangFan-Tien ChengRobin LaiTina Huang
Published in: CASE (2005)
Keyphrases
  • lightweight
  • main contribution
  • probabilistic model
  • database
  • information retrieval
  • information systems
  • feature selection
  • expert systems
  • collaborative learning