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Visible Watermarking Assessment Metrics Based on Just Noticeable Distortion.
Eduardo Fragoso-Navarro
Manuel Cedillo-Hernandez
Mariko Nakano-Miyatake
Antonio Cedillo-Hernandez
Héctor M. Pérez Meana
Published in:
IEEE Access (2018)
Keyphrases
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pattern recognition
just noticeable distortion