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Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme.

Cristoforo MarzoccaFrancesco Corsi
Published in: J. Electron. Test. (2002)
Keyphrases
  • pseudorandom
  • classification scheme
  • uniformly distributed
  • mixed signal
  • pattern recognition
  • vlsi circuits
  • high speed
  • low power
  • image processing
  • random number
  • signal processing
  • energy consumption