Sign in
Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks.
Cong Hu
Zhi Li
Chuan-pei Xu
Mengyi Jia
Published in:
J. Electron. Test. (2016)
Keyphrases
</>
image processing
wireless sensor networks
data management
data objects
network on chip