Temperature Reliability of Junctionless Twin Gate Recessed Channel (JL-TGRC) MOSFET with Different Gate Material for Low Power Digital-Logic Applications.
Ajay KumarSamarth SinghBalark TiwariRishu ChaujarPublished in: TENCON (2018)
Keyphrases
- low power
- cmos technology
- mixed signal
- nm technology
- power consumption
- low cost
- logic circuits
- high speed
- multi channel
- wireless transmission
- multiple input
- single chip
- vlsi circuits
- delay insensitive
- field effect transistors
- high power
- low power consumption
- low voltage
- power dissipation
- digital signal processing
- parallel processing
- energy dissipation
- vlsi architecture
- liquid crystal displays
- gate array
- wireless networks
- cmos image sensor
- power reduction
- real time
- asynchronous circuits