Sign in

Measuring Time Series' Similarity through Large Singular Features Revealed with Wavelet Transformation.

Zbigniew R. StruzikArno Siebes
Published in: DEXA Workshop (1999)
Keyphrases
  • wavelet transformation
  • multiresolution
  • co occurrence
  • feature extraction
  • feature vectors
  • distance measure
  • feature selection
  • low level
  • image features
  • information content