A cocktail approach on random access scan toward low power and high efficiency test.
Krishnendu ChakrabartyJ. E. ChenPublished in: ICCAD (2005)
Keyphrases
- low power
- high efficiency
- random access
- high speed
- low cost
- power consumption
- high accuracy
- solid state
- single chip
- digital signal processing
- flash memory
- vlsi circuits
- logic circuits
- image sensor
- memory space
- vlsi architecture
- low power consumption
- power dissipation
- computational complexity
- cmos technology
- parallel processing
- mixed signal
- image coding
- ultra low power