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Comparison of reduced analytic models for six-port modulators with different characteristics.

Martin DusekJiri Sebesta
Published in: TSP (2015)
Keyphrases
  • machine learning
  • neural network
  • experimental data
  • real time
  • artificial intelligence
  • computer vision
  • probabilistic model
  • model selection
  • machine learning algorithms
  • process model
  • classification models