The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation.
Lim Shi XuenIsmail Mohd KhairuddinMohd Azraai Mohd RazmanJessnor Arif Mat-JizatEdmund YuenHaochuan JiangEng Hwa YapAnwar P. P. Abdul MajeedPublished in: RiTA (2022)
Keyphrases
- learning models
- support vector machine
- classification models
- machine learning
- svm classifier
- machine learning algorithms
- support vector machine svm
- support vector
- feature space
- loss function
- feature selection
- learning algorithm
- training set
- pattern recognition
- learning tasks
- training data
- feature vectors
- classification accuracy
- kernel methods
- feature extraction
- semi supervised learning
- genetic algorithm
- learning problems
- transfer learning
- conditional random fields
- information retrieval
- learning environment
- decision trees
- kernel function
- text categorization
- maximum likelihood
- image classification
- object recognition
- cost sensitive