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Direct extraction of an empirical temperature-dependent InGaP/GaAs HBT large-signal model.
Arvind Raghavan
Sunitha Venkataraman
Bhaskar Banerjee
Youngsuk Suh
Deukhyoun Heo
Joy Laskar
Published in:
IEEE J. Solid State Circuits (2003)
Keyphrases
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formal model
mathematical model
computational model
probabilistic model
machine learning
statistical model
cost function
high level
prior knowledge
objective function
multiscale
management system
signal processing
non stationary
face recognition
genetic algorithm
real time
hybrid model
measured data