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An Intelligent Factory Automation System With Multivariate Time Series Algorithm for Chip Probing Process.

Yu-Ming HsiehChin-Yi LinJan WilchBirgit Vogel-HeuserYu-Chen LinYu-Chuan LinMin-Hsiung HungFan-Tien Cheng
Published in: IEEE Robotics Autom. Lett. (2023)
Keyphrases
  • preprocessing
  • k means
  • data analysis
  • data sets
  • clustering algorithm
  • face recognition
  • multiscale
  • input data
  • segmentation algorithm