Semi-Supervised Deep Learning for Microcontroller Performance Screening.
Nicolò BellarminoRiccardo CantoroMartin HuchTobias KilianUlf SchlichtmannGiovanni SquilleroPublished in: ETS (2023)
Keyphrases
- deep learning
- semi supervised
- unsupervised learning
- weakly supervised
- semi supervised learning
- labeled data
- supervised learning
- unlabeled data
- unsupervised feature learning
- pairwise
- machine learning
- active learning
- mental models
- restricted boltzmann machine
- deep architectures
- higher order
- similarity measure
- named entity recognition
- decision trees