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Application of structured total least squares for system identification and model reduction.

Ivan MarkovskyJan C. WillemsSabine Van HuffelBart De MoorRik Pintelon
Published in: IEEE Trans. Autom. Control. (2005)
Keyphrases
  • probabilistic model
  • cost function
  • probability distribution
  • high quality
  • bayesian networks
  • objective function
  • distance measure
  • level set
  • total least squares