VHDL modeling and model testing for DSP applications.
James R. ArmstrongF. Gail GrayMeng-Wei LinPublished in: IEEE Trans. Ind. Electron. (1999)
Keyphrases
- modeling method
- probabilistic model
- computational model
- high level
- modeling tool
- formal model
- conceptual model
- mathematical model
- theoretical framework
- cost function
- signal processing
- low cost
- probability distribution
- statistical model
- experimental data
- neural network model
- simulation model
- control system
- prior knowledge
- digital signal processing
- case study
- model validation