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Monitoring high-yields processes with defects count in nonconforming items by artificial neural network.
Babak Abbasi
Seyed Taghi Akhavan Niaki
Published in:
Appl. Math. Comput. (2007)
Keyphrases
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artificial neural networks
considerable increase
back propagation
neural network
artificial intelligence
wide range
monitoring system
computational models
information systems
decision support system
high efficiency