Statistical variability in FinFET devices with intrinsic parameter fluctuations.

Chih-Hong Hwang Yiming Li Ming-Hung Han

Published in: Microelectron. Reliab. (2010)

Keyphrases

mobile devices
statistical analysis
statistical information
information theoretic
embedded devices
database
machine learning
website
probabilistic model
information theory
parameter values
parameter settings
embedded systems
geometric structure
input parameters