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Automatic identification and location technology of glass insulator self-shattering.

Xinbo HuangHuiying ZhangYe Zhang
Published in: J. Electronic Imaging (2017)
Keyphrases
  • automatic identification
  • cost effective
  • multiscale
  • data processing
  • rapid development
  • neural network
  • information systems
  • feature extraction
  • pattern recognition
  • personal computer