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The impact of feature reduction techniques on defect prediction models.

Masanari KondoCor-Paul BezemerYasutaka KameiAhmed E. HassanOsamu Mizuno
Published in: Empir. Softw. Eng. (2019)
Keyphrases
  • probabilistic model
  • feature reduction
  • neural network
  • image processing
  • defect prediction
  • image segmentation
  • similarity measure
  • random forest