Login / Signup
Origin of the Half-Wavelength Errors in Microwave Measurements Using Through-Line Calibrations.
P. Mark Buff
Jayesh Nath
Michael B. Steer
Published in:
IEEE Trans. Instrum. Meas. (2007)
Keyphrases
</>
measurement errors
measurement noise
measurement error
line segments
data sets
infrared
error analysis
error propagation