Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application.

B. Muralikrishnan Kayvan Najarian J. Raja

Published in: ICPR (1) (2002)

Keyphrases

process control
data points
clustering method
knowledge base
clustering algorithm
k means
data objects
process model
self organizing maps
d objects
fuzzy clustering
correlation coefficient
high dimensional data
data mining
mobile robot
viewpoint
data analysis
computer vision