Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning.
Daniel Gutierrez-RojasMehar UllahIoannis T. ChristouGustavo AlmeidaPedro H. J. NardelliDick CarrilloJean Michel de Souza Sant'AnaHirley AlvesMerim DzaferagicAlessandro ChiumentoCharalampos KalalasPublished in: CoRR (2020)
Keyphrases
- machine learning
- detect anomalies
- anomaly detection
- machine learning methods
- machine learning algorithms
- pattern recognition
- real world
- information extraction
- industrial applications
- computer science
- natural language processing
- learning algorithm
- active learning
- technology transfer
- feature selection
- computer vision
- knowledge acquisition
- explanation based learning
- multi layer
- text mining
- model selection
- supervised learning
- knowledge representation
- reinforcement learning
- decision trees
- artificial intelligence
- multi dimensional
- inductive learning
- expert systems
- application layer
- industrial processes