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Measuring the Magnitude of Envelope Fluctuations: Should We Use the PAPR?

Pedro BentoJoao NunesMarco Alexandre Cravo GomesRui DinisVítor Manuel Mendes da Silva
Published in: VTC Fall (2014)
Keyphrases
  • high capacity
  • phase shift
  • machine learning
  • computer vision
  • ofdm system
  • databases
  • high level
  • database systems
  • multiscale
  • end to end