A Compact First-Order ΣΔ Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process.
Takao OshitaJoseph ShorDavid E. DuarteAvner KornfeldGeorge L. GeannopoulosJonathan DouglasNasser A. KurdPublished in: IEEE J. Solid State Circuits (2016)