Login / Signup
Reliability Estimation of Approximate Circuits Based on Probabilistic Gate Model.
Tao Wang
Jianhui Jiang
Zhen Wang
Published in:
PRDC (2019)
Keyphrases
</>
probabilistic model
computational model
prior knowledge
formal model
similarity measure
probability distribution
management system
experimental data
conceptual model
information retrieval
high level
artificial neural networks
theoretical analysis
independence assumption