An efficient Bayesian yield estimation method for high dimensional and high sigma SRAM circuits.
Jinyuan ZhaiChanghao YanSheng-Guo WangDian ZhouPublished in: DAC (2018)
Keyphrases
- high precision
- significant improvement
- high accuracy
- dynamic programming
- parameter estimation
- classification method
- preprocessing
- cost function
- cross validation
- bayesian estimation
- noisy data
- clustering method
- high dimensional
- computationally efficient
- input data
- data points
- computational cost
- similarity measure
- genetic algorithm