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Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by measurement of electric field-induced optical second-harmonic generation.

Takashi KatsunoTakaaki ManakaTsuyoshi IshikawaHiroyuki UedaTsutomu UesugiMitsumasa Iwamoto
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • image analysis
  • statistical analysis
  • data analysis
  • data acquisition
  • electric field
  • real time
  • data sets
  • image sequences
  • clinical applications