A novel algorithm for defect inspection of touch panels.
Mao-Hsiung HungChaur-Heh HsiehPublished in: Image Vis. Comput. (2015)
Keyphrases
- preprocessing
- k means
- learning algorithm
- single pass
- computational complexity
- search space
- times faster
- np hard
- optimization algorithm
- expectation maximization
- high accuracy
- recognition algorithm
- selection algorithm
- probabilistic model
- computational cost
- experimental evaluation
- improved algorithm
- significant improvement
- detection algorithm
- worst case
- computationally efficient
- clustering method
- particle swarm optimization
- memory requirements
- least squares
- scheduling problem
- cost function
- objective function