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Comparison between BSIM4.X and HSPICE flicker noise models in NMOS and PMOS transistors in all operating regions.
Thomas Noulis
Stylianos Siskos
Gérard Sarrabayrouse
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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probabilistic model
missing data
statistical models
model selection
gray level
experimental data
parameter space
image structure
integrated circuit