Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference.
Mark YearyWendy Van MoerPublished in: IEEE Trans. Instrum. Meas. (2011)
Keyphrases
- special issue
- databases and information systems
- international journal
- computer society
- ecml pkdd
- data acquisition
- ai edam
- applied intelligence
- selected papers
- national science foundation
- computer science
- international conference
- advances in artificial intelligence
- annual conference
- san diego supercomputer center
- databases
- papers included
- special session
- intelligent agent technology
- management science
- artificial intelligence
- machine learning