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At-Speed Testing of SOC ICs.

Vlado VorisekThomas KochHermann Fischer
Published in: DATE (2004)
Keyphrases
  • low power
  • real time
  • hardware and software
  • database
  • machine learning
  • databases
  • real world
  • information retrieval
  • computer vision
  • embedded systems
  • software testing
  • processing speed