Sensitivity Analysis in Bayesian Classification Models: Multiplicative Deviations.
Moshe Ben-BassatKarin L. KloveMax Harry WeilPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (1980)
Keyphrases
- sensitivity analysis
- classification models
- managerial insights
- decision trees
- feature selection
- training data
- influence diagrams
- feature set
- software quality classification
- variational inequalities
- learning models
- bayesian networks
- bayes classifiers
- attribute selection
- genetic algorithm
- models built
- closed form
- neural network