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Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance.
Ashish Srivastava
Saumil Shah
Kanak Agarwal
Dennis Sylvester
David T. Blaauw
Stephen W. Director
Published in:
DAC (2005)
Keyphrases
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computationally efficient
power consumption
accurate estimation
high quality
higher level
computationally expensive
database
information systems
case study
high level
parameter estimation
high precision
levels of abstraction
estimation accuracy
estimation process