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Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage Degradation and Differential-Pair-Based Memory Design.
Zhichao Chen
Yang Xiao
Li Du
Yuan Du
Published in:
ISCAS (2023)
Keyphrases
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case study
circuit design
artificial intelligence
design process
design principles
engineering design
power dissipation
database
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neural network
high speed
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computer aided
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memory space