Guest Editors' Introduction: Special Issue on EDA Industry Standards.
Shishpal S. RawatSumit DasGuptaPublished in: IEEE Des. Test Comput. (2012)
Keyphrases
- special issue
- ecml pkdd
- ai edam
- international journal
- applied intelligence
- special section
- practical experiences
- case study
- widely accepted
- virtual machine
- world wide
- web services
- estimation of distribution algorithms
- artificial intelligence
- data mining
- differential evolution
- decision support system
- multi agent systems
- metadata
- decision making