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Successive breakdown mode of time-dependent dielectric breakdown for Cu interconnects and lifetime enhancement under dynamic bias stress.

Sol-Kyu LeeKyung-Tae JangSeol-Min YiYoung-Chang Joo
Published in: IRPS (2018)
Keyphrases
  • input output
  • image processing
  • genetic algorithm
  • information systems
  • decision trees
  • dynamic environments
  • image enhancement
  • data gathering