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Digital background and blind calibration for clock skew error in time-interleaved analog-to-digital converters.

David CamareroJean-François NavinerPatrick Loumeau
Published in: SBCCI (2004)
Keyphrases
  • error rate
  • circuit design
  • data sets
  • low cost
  • neural network
  • high speed
  • signal processing
  • d scene
  • digital content
  • data conversion
  • sigma delta
  • printed circuit