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A deep learning method for pinwheel artifact reduction in CT.

Utkarsh AgrawalRajesh LangojuYasuhiro ImaiRisa ShigemasaBipul Das
Published in: Medical Imaging: Image Processing (2023)
Keyphrases
  • deep learning
  • segmentation method
  • pairwise
  • fault tolerant
  • similarity measure
  • distributed systems
  • machine learning
  • multiscale
  • active learning
  • principal component analysis