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Devices' optimization against hot-carrier degradation in high voltage pLEDMOS transistor.

Hong WuQinsong QianSiyang LiuWeifeng SunLongxing Shi
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • high voltage
  • partial discharge
  • operating conditions
  • high speed
  • optimization problems
  • neural network
  • mobile devices
  • optimization algorithm
  • test set
  • evolutionary computation
  • optimization method
  • normal operation