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Devices' optimization against hot-carrier degradation in high voltage pLEDMOS transistor.
Hong Wu
Qinsong Qian
Siyang Liu
Weifeng Sun
Longxing Shi
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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high voltage
partial discharge
operating conditions
high speed
optimization problems
neural network
mobile devices
optimization algorithm
test set
evolutionary computation
optimization method
normal operation