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Foreword to the Special Issue on "New Challenges and Opportunities in Scatterometry".
Julia Figa-Saldana
Klaus Scipal
David G. Long
Mark A. Bourassa
Wolfgang Wagner
Ad Stoffelen
Published in:
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens. (2017)
Keyphrases
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special issue
advanced technologies
international journal
ai edam
lessons learned
key issues
applied intelligence
ecml pkdd
machine learning
special section
emerging technologies
open issues
technological solutions