A High-Frequency Signal Test Method for Embedded CMOS Op-amps.

Kang Chul Kim Seok Bung Han

Published in: J. Inform. and Commun. Convergence Engineering (2005)

Keyphrases

high frequency
high frequency components
low frequency
high resolution
subband
visual quality
wavelet decomposition
wavelet transformation
multi resolution analysis
phase shifting
similarity measure
wavelet transform
transfer function
blocking artifacts
contourlet transform